| Transmission Electron Microscopy of Minerals and Rocks Revised Edition Contributor(s): McLaren, Alex C. (Author), Putnis, Andrew (Editor), Liebermann, Robert C. (Editor) |
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ISBN: 0521350980 ISBN-13: 9780521350983 Publisher: Cambridge University Press OUR PRICE: $175.75 Product Type: Hardcover - Other Formats Published: April 1991 |
| Additional Information |
| BISAC Categories: - Science | Earth Sciences - Mineralogy |
| Dewey: 549.12 |
| LCCN: 90020039 |
| Series: Problems in the Behavioural Sciences |
| Physical Information: 1.3" H x 6.2" W x 9.1" (1.54 lbs) 400 pages |
| Descriptions, Reviews, Etc. |
| Publisher Description: Of the many techniques that have been applied to the study of crystal defects, none has contributed more to our understanding of their nature and influence on the physical and chemical properties of crystalline materials than transmission electron microscopy (TEM). TEM is now used extensively by an increasing number of earth scientists for direct observation of defect microstructures in minerals and rocks. Transmission Electron Microscopy of Rocks and Minerals is an introduction to the principles of the technique and is the only book to date on the subject written specifically for geologists and mineralogists. The first part of the book deals with the essential physics of the transmission electron microscope and presents the basic theoretical background required for the interpretation of images and electron diffraction patterns. The final chapters are concerned with specific applications of TEM in mineralogy and deal with such topics as planar defects, intergrowths, radiation-induced defects, dislocations and deformation-induced microstructures. The examples cover a wide range of rock-forming minerals from crustal rocks to those in the lower mantle, and also take into account the role of defects in important mineralogical and geological processes. |