| CMOS Test and Evaluation: A Physical Perspective Softcover Repri Edition Contributor(s): Bhushan, Manjul (Author), Ketchen, Mark B. (Author) |
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ISBN: 1493947028 ISBN-13: 9781493947027 Publisher: Springer OUR PRICE: $123.49 Product Type: Paperback - Other Formats Published: September 2016 |
| Additional Information |
| BISAC Categories: - Technology & Engineering | Electronics - Semiconductors - Technology & Engineering | Quality Control - Science | Physics - Electricity |
| Dewey: 537.622 |
| Physical Information: 0.89" H x 6.14" W x 9.21" (1.35 lbs) 424 pages |
| Descriptions, Reviews, Etc. |
| Publisher Description: CMOS Test and Evaluation: A Physical Perspective is a single source for an integrated view of test and data analysis methodology for CMOS products, covering circuit sensitivities to MOSFET characteristics, impact of silicon technology process variability, applications of embedded test structures and sensors, product yield, and reliability over the lifetime of the product. This book also covers statistical data analysis and visualization techniques, test equipment and CMOS product specifications, and examines product behavior over its full voltage, temperature and frequency range. |