| Wafer-Level Testing and Test During Burn-In for Integrated Circuits Contributor(s): Bahukudumbi, Sudarshan (Author), Chakrabarty, Krishnendu (Author) |
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ISBN: 1596939893 ISBN-13: 9781596939899 Publisher: Artech House Publishers OUR PRICE: $103.55 Product Type: Hardcover Published: February 2010 |
| Additional Information |
| BISAC Categories: - Technology & Engineering | Electronics - Circuits - Integrated |
| Dewey: 621.381 |
| LCCN: 2010455090 |
| Series: Artech House Integrated Microsystems |
| Physical Information: 0.7" H x 6.2" W x 9.1" (0.95 lbs) 198 pages |