X-Ray Diffraction by Disordered Lamellar Structures: Theory and Applications to Microdivided Silicates and Carbons Softcover Repri Edition Contributor(s): Besson, Gerard, Drits, Victor A. (Author), Guinier, Andre (Foreword by) |
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ISBN: 364274804X ISBN-13: 9783642748042 Publisher: Springer OUR PRICE: $104.49 Product Type: Paperback - Other Formats Published: December 2011 |
Additional Information |
BISAC Categories: - Science | Chemistry - Inorganic - Science | Earth Sciences - Mineralogy - Science | Physics - Crystallography |
Dewey: 548.83 |
Physical Information: 0.81" H x 6.14" W x 9.21" (1.21 lbs) 371 pages |
Descriptions, Reviews, Etc. |
Publisher Description: New methods for the determination of the nature, proportion, and distribution of structural defects in microcrystallized lamellar systems are of utmost importance not only to experimentalists but also to theoreticians. Mathematical formalism - indispensable for such analyses - is well-illustrated by various examples, allowing this method to be easily adopted and even to be applied to other solids with lamellar or pseudo-lamellar structures. |