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X-Ray Diffraction by Disordered Lamellar Structures: Theory and Applications to Microdivided Silicates and Carbons Softcover Repri Edition
Contributor(s): Besson, Gerard, Drits, Victor A. (Author), Guinier, Andre (Foreword by)
ISBN: 364274804X     ISBN-13: 9783642748042
Publisher: Springer
OUR PRICE:   $104.49  
Product Type: Paperback - Other Formats
Published: December 2011
Qty:
Additional Information
BISAC Categories:
- Science | Chemistry - Inorganic
- Science | Earth Sciences - Mineralogy
- Science | Physics - Crystallography
Dewey: 548.83
Physical Information: 0.81" H x 6.14" W x 9.21" (1.21 lbs) 371 pages
 
Descriptions, Reviews, Etc.
Publisher Description:
New methods for the determination of the nature, proportion, and distribution of structural defects in microcrystallized lamellar systems are of utmost importance not only to experimentalists but also to theoreticians. Mathematical formalism - indispensable for such analyses - is well-illustrated by various examples, allowing this method to be easily adopted and even to be applied to other solids with lamellar or pseudo-lamellar structures.