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  (4 items found)
Title Author / Artist Prod Type ISBN/ISBN-13
or UPC		 Pub
Date		 Price
From Contamination to Defects, Faults and Yield Loss: Simulation and Applications 1996 Edition (Frontiers in Electronic Testing)Khare, Jitendra B.Hardcover0792397142 /
9780792397144		04/1996$104.49
From Contamination to Defects, Faults and Yield Loss: Simulation and Applications Softcover Repri Edition (Frontiers in Electronic Testing)Khare, Jitendra B.Paperback146128595X /
9781461285953		09/2011$104.49
VLSI Design for Manufacturing: Yield Enhancement Softcover Repri Edition (The Springer International Engineering and Computer Science)Director, Stephen W.Paperback1461288169 /
9781461288169		09/2011$161.49
VLSI Design for Manufacturing: Yield Enhancement 1990 Edition (The Springer International Engineering and Computer Science)Director, Stephen W.Hardcover0792390547 /
9780792390541		11/1989$161.49
  (4 items found)