| Yield and Reliability in Microwave Circuit and System Design Contributor(s): Meehan, Michael D. (Author), Purviance, John (Joint Author), Meehan, Michael D. (Preface by) |
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ISBN: 0890065276 ISBN-13: 9780890065273 Publisher: Artech House Publishers OUR PRICE: $101.65 Product Type: Hardcover Published: December 1993 |
| Additional Information |
| BISAC Categories: - Technology & Engineering | Microwaves - Technology & Engineering | Electrical - Technology & Engineering | Electronics - General |
| Dewey: 621.381 |
| LCCN: 92-27018 |
| Series: Artech House Microwave Library (Hardcover) |
| Physical Information: 0.84" H x 6.25" W x 9.34" (1.29 lbs) 300 pages |
| Descriptions, Reviews, Etc. |
| Publisher Description: This reference is for anyone involved with microwave design. It tackles the practical aspects of microwave statistical design and introduces statistical design techniques that encompass many different applications. This presentation focuses on two main example areas - microwave circuits and systems - but any application with a complex relation between design variables and performance and design variable uncertainty can benefit from statistical design. |