| Optimizing PIXE and INAA Techniques for the Analyses of Mine Tailings Contributor(s): Olise, Felix (Author) |
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ISBN: 3639210263 ISBN-13: 9783639210262 Publisher: VDM Verlag OUR PRICE: $60.53 Product Type: Paperback Published: February 2011 |
| Additional Information |
| BISAC Categories: - Science | Physics - Nuclear |
| Physical Information: 0.34" H x 6" W x 9" (0.49 lbs) 144 pages |
| Descriptions, Reviews, Etc. |
| Publisher Description: Singly charged helium (4He+) induced PIXE and INAA techniques were used for the elemental analyses of tin mining tailings. The PIXE procedure gave very good results especially when a correction was implemented for x-ray absorption in the low-Z region of the spectrum. The use of helium ions to induce X-ray emission was found to be adequate, especially in the case of the intermediate light elements (12 |