| Advances in Imaging and Electron Physics: Volume 116 Contributor(s): Hawkes, Peter W. (Editor) |
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ISBN: 0120147580 ISBN-13: 9780120147588 Publisher: Academic Press OUR PRICE: $272.25 Product Type: Hardcover Published: June 2001 Annotation: Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. |
| Additional Information |
| BISAC Categories: - Technology & Engineering | Materials Science - General - Technology & Engineering | Mechanical - Technology & Engineering | Imaging Systems |
| Dewey: 621.367 |
| Series: Advances in Imaging and Electron Physics |
| Physical Information: 1.08" H x 6.34" W x 9.34" (1.77 lbs) 451 pages |
| Descriptions, Reviews, Etc. |
| Publisher Description: Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. |