| Advances in Imaging and Electron Physics: Electron Emission Physics Volume 149 Contributor(s): Jensen, Kevin (Author), Hawkes, Peter W. (Editor) |
|
 |
ISBN: 0123742072 ISBN-13: 9780123742070 Publisher: Academic Press OUR PRICE: $261.25 Product Type: Hardcover - Other Formats Published: November 2007 Annotation: Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains |
| Additional Information |
| BISAC Categories: - Science | Electron Microscopes & Microscopy - Science | Microscopes & Microscopy - Technology & Engineering | Imaging Systems |
| Dewey: 621.367 |
| Series: Advances in Imaging & Electron Physics |
| Physical Information: 0.88" H x 6.56" W x 9.07" (1.54 lbs) 360 pages |
| Descriptions, Reviews, Etc. |
| Publisher Description: Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. This thematic volume is on the topic of Field-emission Source Mechanisms and is authored by Kevin Jensen, Naval Research Laboratory, Washington, DC. |