| Advances in Imaging and Electron Physics: Optics of Charged Particle Analyzers Volume 157 Contributor(s): Hawkes, Peter W. (Editor) |
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ISBN: 0123747686 ISBN-13: 9780123747686 Publisher: Academic Press OUR PRICE: $272.25 Product Type: Hardcover Published: August 2009 Annotation: Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. * Contributions from leading international scholars and industry experts * Discusses hot topic areas and presents current and future research trends * Invaluable reference and guide for physicists, engineers and mathematicians |
| Additional Information |
| BISAC Categories: - Technology & Engineering | Electronics - Microelectronics - Computers | Data Processing - Technology & Engineering | Materials Science - General |
| Dewey: 621.367 |
| Series: Advances in Imaging and Electron Physics |
| Physical Information: 1.26" H x 6.28" W x 9.26" (1.67 lbs) 373 pages |
| Descriptions, Reviews, Etc. |
| Publisher Description: Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. |