| Advances in Imaging and Electron Physics: Theory of Intense Beams of Charged Particles Volume 166 Contributor(s): Hawkes, Peter W. (Editor) |
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ISBN: 0123813107 ISBN-13: 9780123813107 Publisher: Academic Press OUR PRICE: $257.40 Product Type: Hardcover - Other Formats Published: June 2011 |
| Additional Information |
| BISAC Categories: - Science | Electron Microscopes & Microscopy - Computers | Data Processing - Technology & Engineering | Electronics - Microelectronics |
| Dewey: 621.367 |
| Series: Advances in Imaging and Electron Physics |
| Physical Information: 1.56" H x 6" W x 9" (2.57 lbs) 752 pages |
| Descriptions, Reviews, Etc. |
| Publisher Description: Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. |