Advances in Imaging and Electron Physics: Optics of Charged Particle Analyzers Volume 163 Contributor(s): Hawkes, Peter W. (Editor) |
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ISBN: 012381314X ISBN-13: 9780123813145 Publisher: Academic Press OUR PRICE: $247.00 Product Type: Hardcover Published: July 2010 |
Additional Information |
BISAC Categories: - Science | Electron Microscopes & Microscopy - Science | Microscopes & Microscopy - Technology & Engineering | Imaging Systems |
Dewey: 621.367 |
Series: Advances in Imaging & Electron Physics |
Physical Information: 0.7" H x 6" W x 9" (1.05 lbs) 248 pages |
Descriptions, Reviews, Etc. |
Publisher Description: Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. |