| Advances in Imaging and Electron Physics: Part a Volume 172 Contributor(s): Cremer Jr, Jay Theodore |
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ISBN: 0123944228 ISBN-13: 9780123944221 Publisher: Academic Press OUR PRICE: $232.75 Product Type: Hardcover - Other Formats Published: July 2012 |
| Additional Information |
| BISAC Categories: - Technology & Engineering | Electronics - Microelectronics - Technology & Engineering | Mechanical - Computers | Data Processing |
| Dewey: 621.367 |
| Series: Advances in Imaging and Electron Physics |
| Physical Information: 696 pages |
| Descriptions, Reviews, Etc. |
| Publisher Description: This special volume of Advances in Imaging and Electron Physics details the current theory, experiments, and applications of neutron and x-ray optics and microscopy for an international readership across varying backgrounds and disciplines. Edited by Dr. Ted Cremer, these volumes attempt to provide rapid assimilation of the presented topics that include neutron and x-ray scatter, refraction, diffraction, and reflection and their potential application. |