| Crustal Structure and Deep Deformation of the Chinese Mainland: Evidence from Deep Seismic Reflection Profiles and Other Geophysical Data Sets Contributor(s): Gao, Rui (Editor) |
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ISBN: 012813559X ISBN-13: 9780128135594 Publisher: Elsevier OUR PRICE: $161.50 Product Type: Paperback - Other Formats Published: July 2022 |
| Additional Information |
| BISAC Categories: - Science | Physics - Geophysics - Science | Earth Sciences - Geology - Science | Earth Sciences - Seismology & Volcanism |
| Physical Information: 400 pages |
| Descriptions, Reviews, Etc. |
| Publisher Description: Crustal Structure and Deep Deformation of the Chinese Mainland: Evidence from Deep Seismic Reflection Profiles and Other Geophysical Data Sets collects all available seismic reflection experiments that have been carried out in the Chinese mainland since the 1990s. Such data sheds light on the crustal-scale structure of major tectonic units in the Chinese mainland which reflect typical tectonic belts seen worldwide. Including full analysis and applications of the data as well as high-resolution images of the seismic reflection profiles themselves, this book provides valuable insight that can be applied globally for geologists, geophysicists and seismologists studying crustal structure and tectonics. Data from the Tibetan Plateau, which contains double normal thickness crust, is particularly valuable in providing details and an understanding of ongoing continent-continent collision. |