Nondestructive Evaluation of Materials: Sagamore Army Materials Research Conference Proceedings 23 1979 Edition Contributor(s): Weiss, Volker (Author), Burke, John J. (Author) |
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ISBN: 0306401851 ISBN-13: 9780306401855 Publisher: Springer OUR PRICE: $94.05 Product Type: Hardcover - Other Formats Published: November 1979 |
Additional Information |
BISAC Categories: - Science | Nanoscience - Science | Physics - Condensed Matter - Technology & Engineering | Nanotechnology & Mems |
Dewey: 620.112 |
LCCN: 79012538 |
Series: Sagamore Army Materials Research Conference Proceedings |
Physical Information: 530 pages |
Descriptions, Reviews, Etc. |
Publisher Description: The Army Materials and Mechanics Research Center of Water- town, Massachusetts in cooperation with the Materials Science Group of the Department of Chemical Engineering and Materials Science of Syracuse University has conducted the Sagamore Army Materials Research Conference since 1954. The main purpose of these conferences has been to gather together over 150 scientists and engineers from academic institutions, industry and government who are uniquely qualified to explore in depth a subject of importance to the Department of Defense, the Army and the scientific community. This volume NONDESTRUCTIVE EVALUATION OF MATERIALS, addresses the areas of x-ray, ultrasonics and other methods of nondestructive testing. We wish to acknowledge the dedicated assistance of Joseph M. Bernier of the Army Materials and Mechanics Research Center and Helen Brown DeMascio of Syracuse University throughout the stages of the conference planning and finally the publication of this book. Their help is deeply appreciated. Syracuse University Syracuse, New York The Editors Contents SESSION I X-RAY S. Heissman, Moderator H. K. Herglotz, Moderator 1. Overview of X-Ray Diffraction Methods for Nondestructive Testing - - - - - - - --- 1 L. V. Azaroff 2. Detection of Fatigue Damage by X-Rays 21 S. Taira and K. Kamachi 3. A Historical Example of Fatigue Damage - - - - - - - 55 H. K. Herglotz 4. The Application of X-Ray Topography to Materials Science . . . . . . . . . . . . . . . . . . . . 69 S. Weissman 5. |