| Advances in X-Ray Analysis 1991 Edition Contributor(s): Barrett, C. S. (Editor), Amara, M. (Editor), Huang, Ting C. (Editor) |
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ISBN: 0306440032 ISBN-13: 9780306440038 Publisher: Springer OUR PRICE: $94.05 Product Type: Hardcover - Other Formats Published: June 1991 |
| Additional Information |
| BISAC Categories: - Science | Chemistry - Physical & Theoretical - Science | Physics - Nuclear - Technology & Engineering | Electrical |
| Dewey: 541 |
| Series: Advances in X-Ray Analysis |
| Physical Information: 743 pages |
| Descriptions, Reviews, Etc. |
| Publisher Description: The 39th Annual Denver X-Ray Conference on Applications of X-Ray Analysis was held July 30 -August 3, 1990, at the Sheraton Steamboat Resort and Conference Center, Steamboat Springs, Colorado. The "Denver Conference" is recognized to be a major event in the x-ray analysis field, bringing together scientists and engineers from around the world to discuss the state of the art in x-ray applications as well as indications for future develop- ments. In recent years there has been a steady expansion of applications of x-ray analysis to characterize surfaces and thin films. To introduce the audience to one of the exciting and important new developments in x-ray fluorescence, the topic for the Plenary Session of the 1990 Conference was: "Surface and Near-Surface X-Ray Spectroscopy. " The Conference had the privilege of inviting five leading world experts in the field of x-ray spectroscopy to deliver lectures at the Plenary Session. The first two lectures were on total-reflection x-ray fluorescence spectrometry. Professor P. Wobrauschek of Austria reviewed "Recent Developments and Results in Total-Reflection X-Ray Fluorescence. " Trends and applications of the technique were also discussed. Dr. T. Arai of Japan reported on "Surface and Near-Surface Analysis of Silicon Wafers by Total Reflection X-Ray Fluorescence. " He emphasized the importance of using proper x-ray optics to achieve high signal-to-noise ratios. A mathematical model relating the x-ray intensity to the depth of x-ray penetration was also described. |