| Microscopy Methods in Nanomaterials Characterization: Volume 1 Contributor(s): Thomas, Sabu (Editor), Thomas, Raju (Editor), Zachariah, Ajesh K. (Editor) |
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ISBN: 0323461417 ISBN-13: 9780323461412 Publisher: Elsevier OUR PRICE: $190.00 Product Type: Hardcover Published: May 2017 |
| Additional Information |
| BISAC Categories: - Technology & Engineering | Nanotechnology & Mems - Technology & Engineering | Materials Science - General |
| Dewey: 620.5 |
| LCCN: 2017935091 |
| Series: Micro and Nano Technologies |
| Physical Information: 432 pages |
| Descriptions, Reviews, Etc. |
| Publisher Description: Microscopy Methods in Nanomaterials Characterization fills an important gap in the literature with a detailed look at microscopic and X-ray based characterization of nanomaterials. These microscopic techniques are used for the determination of surface morphology and the dispersion characteristics of nanomaterials. This book deals with the detailed discussion of these aspects, and will provide the reader with a fundamental understanding of morphological tools, such as instrumentation, sample preparation and different kinds of analyses, etc. In addition, it covers the latest developments and trends morphological characterization using a variety of microscopes. Materials scientists, materials engineers and scientists in related disciplines, including chemistry and physics, will find this to be a detailed, method-orientated guide to microscopy methods of nanocharacterization. |
