| Introduction to Focused Ion Beams: Instrumentation, Theory, Techniques and Practice 2005 Edition Contributor(s): Giannuzzi, Lucille A. (Editor), North Carolina State University (Editor) |
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ISBN: 0387231161 ISBN-13: 9780387231167 Publisher: Springer OUR PRICE: $208.99 Product Type: Hardcover - Other Formats Published: November 2004 Annotation: Introduction to Focused Ion Beams is geared towards techniques and applications. This is the only text that discusses and presents the theory directly related to applications and the only one that discusses the vast applications and techniques used in FIBs and dual platform instruments. |
| Additional Information |
| BISAC Categories: - Technology & Engineering | Materials Science - Thin Films, Surfaces & Interfaces - Technology & Engineering | Optics - Technology & Engineering | Electronics - Semiconductors |
| Dewey: 621.381 |
| LCCN: 2004056559 |
| Physical Information: 1.1" H x 6.4" W x 9.3" (1.55 lbs) 357 pages |
| Descriptions, Reviews, Etc. |
| Publisher Description: Introduction to Focused Ion Beams is geared towards techniques and applications. This is the only text that discusses and presents the theory directly related to applications and the only one that discusses the vast applications and techniques used in FIBs and dual platform instruments. |