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Physical Principles of Electron Microscopy: An Introduction to Tem, Sem, and Aem 2005. Corr. 2nd Edition
Contributor(s): Egerton, R. F. (Author)
ISBN: 0387258000     ISBN-13: 9780387258003
Publisher: Springer
OUR PRICE:   $170.99  
Product Type: Hardcover - Other Formats
Published: August 2005
Qty:
Annotation:

Scanning and stationary-beam electron microscopes have become an indispensable tool for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology, and the biological and medical sciences. Physical Principles of Electron Microscopy provides an introduction to the theory and current practice of electron microscopy for undergraduate students who want to acquire an appreciation of how basic principles of physics are utilized in an important area of applied science, and for graduate students and technologists who make use of electron microscopes. At the same time, this book will be equally valuable for university teachers and researchers who need a concise supplemental text that deals with the basic principles of microscopy.

Additional Information
BISAC Categories:
- Science | Electron Microscopes & Microscopy
- Science | Life Sciences - Biophysics
- Science | Nanoscience
Dewey: 502
LCCN: 2005924717
Physical Information: 0.59" H x 6.1" W x 9.66" (0.95 lbs) 202 pages
 
Descriptions, Reviews, Etc.
Publisher Description:

Scanning and stationary-beam electron microscopes have become an indispensable tool for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology, and the biological and medical sciences. Physical Principles of Electron Microscopy provides an introduction to the theory and current practice of electron microscopy for undergraduate students who want to acquire an appreciation of how basic principles of physics are utilized in an important area of applied science, and for graduate students and technologists who make use of electron microscopes. At the same time, this book will be equally valuable for university teachers and researchers who need a concise supplemental text that deals with the basic principles of microscopy.