| Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents and Edition Contributor(s): Foster, Adam (Author), Hofer, Werner A. (Author) |
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ISBN: 0387400907 ISBN-13: 9780387400907 Publisher: Springer OUR PRICE: $161.49 Product Type: Hardcover - Other Formats Published: June 2006 Annotation: Scanning Probe Microscopy is a comprehensive source of information for researchers, teachers, and graduate students about the rapidly expanding field of scanning probe theory. Writing in a tutorial style, the authors explain from scratch the theory behind todays simulation techniques and give examples of theoretical concepts through state-of-the-art simulations, including the means to compare these results with experimental data. The book provides the first comprehensive framework for electron transport theory with its various degrees of approximations, thus allowing extensive insight into the physics of scanning probes. Experimentalists will appreciate how the materials properties influence the instrument's operation, and theorists will understand how simulations can be directly compared to experimental data. |
| Additional Information |
| BISAC Categories: - Science | Electron Microscopes & Microscopy - Technology & Engineering | Materials Science - Thin Films, Surfaces & Interfaces - Technology & Engineering | Nanotechnology & Mems |
| Dewey: 502.82 |
| LCCN: 2005936713 |
| Series: Nanoscience and Technology |
| Physical Information: 0.69" H x 6.14" W x 9.21" (1.30 lbs) 282 pages |
| Descriptions, Reviews, Etc. |
| Publisher Description: Scanning Probe Microscopy is a comprehensive source of information for researchers, teachers, and graduate students about the rapidly expanding field of scanning probe theory. Writing in a tutorial style, the authors explain from scratch the theory behind today's simulation techniques and give examples of theoretical concepts through state-of-the-art simulations, including the means to compare these results with experimental data. The book provides the first comprehensive framework for electron transport theory with its various degrees of approximations, thus allowing extensive insight into the physics of scanning probes. Experimentalists will appreciate how the materials properties influence the instrument's operation, and theorists will understand how simulations can be directly compared to experimental data.
Key Features
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