| Protocol Test Systems VIII: Proceedings of the Ifip Wg6.1 Tc6 Eighth International Workshop on Protocol Test Systems, September 1995 1996 Edition Contributor(s): Cavalli, Ana (Editor), Budkowski, Stan (Editor) |
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ISBN: 0412781107 ISBN-13: 9780412781100 Publisher: Springer OUR PRICE: $208.99 Product Type: Hardcover - Other Formats Published: January 1996 |
| Additional Information |
| BISAC Categories: - Technology & Engineering | Electrical - Technology & Engineering | Electronics - General - Computers | Networking - Hardware |
| Dewey: 004.6 |
| Series: Ifip International Federation for Information Processing |
| Physical Information: 1" H x 6.14" W x 9.21" (1.82 lbs) 452 pages |
| Descriptions, Reviews, Etc. |
| Publisher Description: IWPTS'95 (International Workshop on Protocol Test Systems) is being held this year at NT (Institut National des Telecommunications), Evry, France, from 4 to 6 September, 1995. IWPTS'95 is the eighth of a series of annual meetings sponsored by the IFIP Working Group WG6.1 dedicated to "Architecture and Protocols for Computer Networks". The seven previous workshops were held in Vancouver (Canada, 1988), Berlin (Germany, 1989), Mclean (USA, 1990), Leidschendam (The Netherlands, 1991), Montreal (Canada, 1992), Pau (France, 1993) and Tokyo (Japan, 1994). The workshop is a meeting place where both research and industry, theory and practice come together. By bringing both researchers and practitioners together, IWPTS opens up the communication between these groups. This helps keep the research vital and improves the state of the practitioner's art. Forty-eight papers have been submitted to IWPTS'95 and all of them have been reviewed by the members of the Program Committee and additional reviewers. The completed reviewers list is included in this Proceedings. Based on these reviews, the Program Committee selected 26 for oral presentation and 4 to be presented as posters. Two specially invited papers complete the Workshop Program, which is composed of ten sessions: Testing Methods (Session 1), Test Environments (Session 2), Theoretical Framework (Session 3), Algorithms and Languages (Session 4), Test Generation 1 (Session 5), Testability (Session 6), Test Generation 2 (Session 7), Industrial Applications (Session 8), Distributed Testing and performance (Session 9) and Test Management (Session 10). |