| Aberration-Corrected Analytical Transmission Electron Microscopy Contributor(s): Brydson, Rik (Editor) |
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ISBN: 0470518510 ISBN-13: 9780470518519 Publisher: Wiley OUR PRICE: $67.40 Product Type: Hardcover - Other Formats Published: September 2011 |
| Additional Information |
| BISAC Categories: - Science | Electron Microscopes & Microscopy - Science | Physics - Optics & Light |
| Dewey: 502.825 |
| LCCN: 2011019731 |
| Series: RMS - Royal Microscopical Society |
| Physical Information: 0.8" H x 6.2" W x 9.1" (1.25 lbs) 304 pages |
| Descriptions, Reviews, Etc. |
| Publisher Description: The book is concerned with the theory, background, and practical use of transmission electron microscopes with lens correctors that can correct the effects of spherical aberration. The book also covers a comparison with aberration correction in the TEM and applications of analytical aberration corrected STEM in materials science and biology. This book is essential for microscopists involved in nanoscale and materials microanalysis especially those using scanning transmission electron microscopy, and related analytical techniques such as electron diffraction x-ray spectrometry (EDXS) and electron energy loss spectroscopy (EELS). |