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Runs and Scans with Applications
Contributor(s): Balakrishnan, Narayanaswamy (Author), Koutras, Markos V. (Author)
ISBN: 0471248924     ISBN-13: 9780471248927
Publisher: Wiley
OUR PRICE:   $205.15  
Product Type: Hardcover - Other Formats
Published: November 2001
Qty:
Annotation: Expert practical and theoretical coverage of runs and scans

This volume presents both theoretical and applied aspects of runs and scans, and illustrates their important role in reliability analysis through various applications from science and engineering. Runs and Scans with Applications presents new and exciting content in a systematic and cohesive way in a single comprehensive volume, complete with relevant approximations and explanations of some limit theorems.

The authors provide detailed discussions of both classical and current problems, such as:

  • Sooner and later waiting time
  • Consecutive systems
  • Start-up demonstration testing in life-testing experiments
  • Learning and memory models
  • "Match" in genetic codes

Runs and Scans with Applications offers broad coverage of the subject in the context of reliability and life-testing settings and serves as an authoritative reference for students and professionals alike.
Additional Information
BISAC Categories:
- Mathematics | Probability & Statistics - General
Dewey: 519.2
LCCN: 2001046732
Series: Wiley Probability and Statistics
Physical Information: 1.08" H x 6.24" W x 9.68" (1.73 lbs) 488 pages
 
Descriptions, Reviews, Etc.
Publisher Description:
Dieser Band führt anhand vieler Beispiele aus Naturwissenschaft und Technik in spezielle Kapitel der Zuverlässigkeitsanalyse ein. Theoretische Ausführungen werden anschaulich mit praktischen Anwendungen, meist aus der Industrie, verknüpft, um den Leser zur tiefgründigen Einarbeitung in die Konzepte zu motivieren. Erläutert werden auch relevante Näherungen und Randwertsätze.