| Failure Mechanisms in Semiconductor Devices Revised Edition Contributor(s): Amerasekera, E. Ajith (Author), Najm, Farid N. (Author) |
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ISBN: 0471954829 ISBN-13: 9780471954828 Publisher: Wiley OUR PRICE: $298.25 Product Type: Hardcover Published: August 1997 Annotation: Since the successful first edition of Failure Mechanisms in Semiconductor Devices, semiconductor technology has become increasingly important. The high complexity of todays integrated circuits has engendered a demand for greater component reliability. Reflecting the need for guaranteed performance in consumer applications, this thoroughly updated edition includes more detailed material on reliability modelling and prediction. The book analyses the main failure mechanisms in terms of cause, effects and prevention and explains the mathematics behind reliability analysis. The authors detail methodologies for the identification of failures and describe the approaches for building reliability into semiconductor devices. Their thorough yet accessible text covers the physics of failure mechanisms from the semiconductor die itself to the packaging and interconnections. Incorporating recent advances, this comprehensive survey of semiconductor reliability will be an asset to both engineers and graduate students in the field. |
| Additional Information |
| BISAC Categories: - Technology & Engineering | Electronics - Semiconductors - Technology & Engineering | Electrical |
| Dewey: 621.381 |
| LCCN: 96049978 |
| Physical Information: 1.03" H x 6.53" W x 9.3" (1.36 lbs) 360 pages |
| Descriptions, Reviews, Etc. |
| Publisher Description: In dieser zweiten, aktualisierten Auflage identifizieren die Autoren die Ursachen und Mechanismen, die zu Ausf llen von Halbleiterbauelementen f hren. Durch Erkennungsmethoden und Technologien zur Vermeidung von Defekten, die in diesem Buch ausf hrlich beschrieben werden, wird die Zuverl ssigkeit der Bauelemente in der Praxis entscheidend bestimmt. |