| Defects in Sio2 and Related Dielectrics: Science and Technology 2000 Edition Contributor(s): Pacchioni, Gianfranco (Editor), Skuja, Linards (Editor), Griscom, David L. (Editor) |
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ISBN: 0792366859 ISBN-13: 9780792366850 Publisher: Springer OUR PRICE: $208.99 Product Type: Hardcover - Other Formats Published: December 2000 Annotation: Silicon dioxide plays a central role in most contemporary electronic and photonic technologies, from fiber optics for communications and medical applications to metal-oxide-semiconductor devices. Many of these applications directly involve point defects, which can either be introduced during the manufacturing process or by exposure to ionizing radiation. They can also be deliberately created to exploit new technologies. This book provides a general description of the influence that point defects have on the global properties of the bulk material and their spectroscopic characterization through ESR and optical spectroscopy. |
| Additional Information |
| BISAC Categories: - Science | Physics - Crystallography - Technology & Engineering | Materials Science - General - Medical |
| Dewey: 548.85 |
| LCCN: 00048787 |
| Series: NATO Science Series II: |
| Physical Information: 1.38" H x 6.14" W x 9.21" (2.34 lbs) 624 pages |
| Descriptions, Reviews, Etc. |
| Publisher Description: Silicon dioxide plays a central role in most contemporary electronic and photonic technologies, from fiber optics for communications and medical applications to metal-oxide-semiconductor devices. Many of these applications directly involve point defects, which can either be introduced during the manufacturing process or by exposure to ionizing radiation. They can also be deliberately created to exploit new technologies. This book provides a general description of the influence that point defects have on the global properties of the bulk material and their spectroscopic characterization through ESR and optical spectroscopy. |