| Scan Statistics: Methods and Applications 2009 Edition Contributor(s): Glaz, Joseph (Editor), Pozdnyakov, Vladimir (Editor), Wallenstein, Sylvan (Editor) |
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ISBN: 0817647481 ISBN-13: 9780817647483 Publisher: Birkhauser OUR PRICE: $161.49 Product Type: Hardcover - Other Formats Published: May 2009 |
| Additional Information |
| BISAC Categories: - Mathematics | Probability & Statistics - General - Computers | Computer Science - Mathematics | Applied |
| Dewey: 519.5 |
| LCCN: 2009926299 |
| Series: Statistics for Industry and Technology |
| Physical Information: 0.94" H x 7" W x 10" (2.09 lbs) 394 pages |
| Descriptions, Reviews, Etc. |
| Publisher Description: Scan statistics is currently one of the most active and important areas of research in applied probability and statistics, having applications to a wide variety of fields: archaeology, astronomy, bioinformatics, biosurveillance, molecular biology, genetics, computer science, electrical engineering, geography, material sciences, physics, reconnaissance, reliability and quality control, telecommunication, and epidemiology. Filling a gap in the literature, this self-contained volume brings together a collection of selected chapters illustrating the depth and diversity of theory, methods and applications in the area of scan statistics. |