| Introduction to Focused Ion Beams: Instrumentation, Theory, Techniques and Practice Contributor(s): Giannuzzi, Lucille A. (Editor), North Carolina State University Center f (Editor) |
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ISBN: 1441935746 ISBN-13: 9781441935748 Publisher: Springer OUR PRICE: $132.99 Product Type: Paperback - Other Formats Published: October 2010 |
| Additional Information |
| BISAC Categories: - Technology & Engineering | Optics - Technology & Engineering | Materials Science - Thin Films, Surfaces & Interfaces - Technology & Engineering | Electronics - Semiconductors |
| Dewey: 621.381 |
| Physical Information: 0.78" H x 6.14" W x 9.21" (1.16 lbs) 357 pages |
| Descriptions, Reviews, Etc. |
| Publisher Description: Introduction to Focused Ion Beams is geared towards techniques and applications. This is the only text that discusses and presents the theory directly related to applications and the only one that discusses the vast applications and techniques used in FIBs and dual platform instruments. |
