| Nanoscale Memory Repair Contributor(s): Horiguchi, Masashi (Author), Itoh, Kiyoo (Author) |
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ISBN: 1441979573 ISBN-13: 9781441979575 Publisher: Springer OUR PRICE: $161.49 Product Type: Hardcover - Other Formats Published: January 2011 |
| Additional Information |
| BISAC Categories: - Technology & Engineering | Electronics - Circuits - General - Computers | Cad-cam |
| Dewey: 621.397 |
| Series: Integrated Circuits and Systems |
| Physical Information: 0.69" H x 6.14" W x 9.21" (1.17 lbs) 218 pages |
| Descriptions, Reviews, Etc. |
| Publisher Description: Yield and reliability of memories have degraded with device and voltage scaling in the nano-scale era, due to ever-increasing hard/soft errors and device parameter variations. This book systematically describes these yield and reliability issues in terms of mathematics and engineering, as well as an array of repair techniques, based on the authors' long careers in developing memories and low-voltage CMOS circuits. Nanoscale Memory Repair gives a detailed explanation of the various yield models and calculations, as well as various, practical logic and circuits that are critical for higher yield and reliability. |