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Integrated Imaging and Vision Techniques for Industrial Inspection: Advances and Applications 2015 Edition
Contributor(s): Liu, Zheng (Editor), Ukida, Hiroyuki (Editor), Ramuhalli, Pradeep (Editor)
ISBN: 1447167406     ISBN-13: 9781447167402
Publisher: Springer
OUR PRICE:   $104.49  
Product Type: Hardcover - Other Formats
Published: October 2015
Qty:
Temporarily out of stock - Will ship within 2 to 5 weeks
Additional Information
BISAC Categories:
- Computers | Computer Graphics
- Computers | Computer Vision & Pattern Recognition
Dewey: 006.37
Series: Advances in Computer Vision and Pattern Recognition
Physical Information: 1.26" H x 6.29" W x 9.47" (2.60 lbs) 541 pages
 
Descriptions, Reviews, Etc.
Publisher Description:

This pioneering text/reference presents a detailed focus on the use of machine vision techniques in industrial inspection applications. An internationally renowned selection of experts provide insights on a range of inspection tasks, drawn from their cutting-edge work in academia and industry, covering practical issues of vision system integration for real-world applications.

Topics and features: presents a comprehensive review of state-of-the-art hardware and software tools for machine vision, and the evolution of algorithms for industrial inspection; includes in-depth descriptions of advanced inspection methodologies and machine vision technologies for specific needs; discusses the latest developments and future trends in imaging and vision techniques for industrial inspection tasks; provides a focus on imaging and vision system integration, implementation, and optimization; describes the pitfalls and barriers to developing successful inspection systems for smooth and efficient manufacturing process.

Bridging the gap between theoretical knowledge and engineering practice, this indispensable book will appeal to graduate students interested in imaging, machine vision, and industrial inspection. The work also serves as an excellent reference for researchers seeking to develop innovative solutions to tackle practical challenges, and for professional engineers who will benefit from the coverage of applications at both system and component level.