| Advances in X-Ray Analysis: Volume 28 Softcover Repri Edition Contributor(s): Barrett, Charles S. (Editor), Predecki, Paul K. (Editor) |
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ISBN: 1461294991 ISBN-13: 9781461294993 Publisher: Springer OUR PRICE: $52.24 Product Type: Paperback - Other Formats Published: October 2011 |
| Additional Information |
| BISAC Categories: - Science | Chemistry - Analytic - Technology & Engineering | Materials Science - General - Technology & Engineering | Electrical |
| Dewey: 543.085 |
| Physical Information: 0.84" H x 7" W x 10" (1.57 lbs) 408 pages |
| Descriptions, Reviews, Etc. |
| Publisher Description: The 33rd Annual Denver Conference on Applications of X-Ray Analysis was held July 30-August 3. 1984. on the campus of the University of Denver. Following the recent tradition of alternating plenary lecture topics between X-ray diffraction and X-ray fluorescence at the confer- ence. the plenary sessions dealt with topics of X-ray fluorescence. Prof. H. Aiginger presented a plenary lect re on TOTAL REFLECTANCE X-RAY SPECTROMETRY which admirably described this relatively new technique. J. C. Russ discussed XRF AND OTHER SURFACE ANALYTICAL TECHNIQUES which gave an excellent overview of the role XRF plays in a modern analytical laboratory. J. E. Taggart. Jr. described THE ROLE OF XRF IN A MODERN GEOCHEMICAL LABORATORY and presented many case histories of the configura- tion of analytical equipment in several geochemical laboratories. The plenary lectures demonstrated both the dynamic nature of research in X-ray fluorescence. and the important role X-ray spectrom- etry plays in the arsenal of analytical methods found in modern labora- tories. Total reflectance X-ray spectrometry takes advantage of con- sideration of the geometry of the X-ray optics. Potentially. new sample types may be considered as X-ray fluorescence specimens using this technique. |