Robust Sram Designs and Analysis 2012 Edition Contributor(s): Singh, Jawar (Author), Mohanty, Saraju P. (Author), Pradhan, Dhiraj K. (Author) |
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ISBN: 1461408172 ISBN-13: 9781461408178 Publisher: Springer OUR PRICE: $151.99 Product Type: Hardcover - Other Formats Published: July 2012 |
Additional Information |
BISAC Categories: - Technology & Engineering | Electronics - Circuits - General - Technology & Engineering | Nanotechnology & Mems - Computers | Computer Engineering |
Dewey: 621.397 |
LCCN: 2012936831 |
Physical Information: 0.44" H x 6.14" W x 9.21" (0.95 lbs) 168 pages |
Descriptions, Reviews, Etc. |
Publisher Description: This book provides a guide to Static Random Access Memory (SRAM) bitcell design and analysis to meet the nano-regime challenges for CMOS devices and emerging devices, such as Tunnel FETs. Since process variability is an ongoing challenge in large memory arrays, this book highlights the most popular SRAM bitcell topologies (benchmark circuits) that mitigate variability, along with exhaustive analysis. Experimental simulation setups are also included, which cover nano-regime challenges such as process variation, leakage and NBTI for SRAM design and analysis. Emphasis is placed throughout the book on the various trade-offs for achieving a best SRAM bitcell design.
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