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IONSIMS (Vol. 4): Ion Implanted Depth Distributions Measured Using Secondary Ion Mass Spectrometry
Contributor(s): Wilson, R. G. (Author), Zavada, J. M. (Author)
ISBN: 1478789166     ISBN-13: 9781478789161
Publisher: Outskirts Press
OUR PRICE:   $93.46  
Product Type: Paperback
Published: June 2017
* Not available - Not in print at this time *
Additional Information
BISAC Categories:
- Science | Physics - Atomic & Molecular
- Technology & Engineering | Electronics - Semiconductors
Physical Information: 2.43" H x 8.5" W x 11.02" (6.04 lbs) 894 pages