| Test and Diagnosis for Small-Delay Defects 2012 Edition Contributor(s): Tehranipoor, Mohammad (Author), Peng, Ke (Author), Chakrabarty, Krishnendu (Author) |
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ISBN: 1489989528 ISBN-13: 9781489989529 Publisher: Springer OUR PRICE: $123.49 Product Type: Paperback - Other Formats Published: November 2014 |
| Additional Information |
| BISAC Categories: - Technology & Engineering | Electronics - Circuits - General - Computers | Computer Science - Technology & Engineering | Nanotechnology & Mems |
| Dewey: 621.395 |
| Physical Information: 0.49" H x 6.14" W x 9.21" (0.73 lbs) 212 pages |
| Descriptions, Reviews, Etc. |
| Publisher Description: This book will introduce new techniques for detecting and diagnosing small-delay defects in integrated circuits. Although this sort of timing defect is commonly found in integrated circuits manufactured with nanometer technology, this will be the first book to introduce effective and scalable methodologies for screening and diagnosing small-delay defects, including important parameters such as process variations, crosstalk, and power supply noise. |