| Modeling Nanoscale Imaging in Electron Microscopy 2012 Edition Contributor(s): Vogt, Thomas (Editor), Dahmen, Wolfgang (Editor), Binev, Peter (Editor) |
|
 |
ISBN: 1489997288 ISBN-13: 9781489997289 Publisher: Springer OUR PRICE: $104.49 Product Type: Paperback - Other Formats Published: April 2014 |
| Additional Information |
| BISAC Categories: - Science | Chemistry - Analytic - Science | Chemistry - Physical & Theoretical - Technology & Engineering | Nanotechnology & Mems |
| Dewey: 502.825 |
| Series: Nanostructure Science and Technology |
| Physical Information: 0.5" H x 5.9" W x 9" (0.65 lbs) 182 pages |
| Descriptions, Reviews, Etc. |
| Publisher Description: Modeling Nanoscale Imaging in Electron Microscopy presents the recent advances that have been made using mathematical methods to resolve problems in microscopy. With improvements in hardware-based aberration software significantly expanding the nanoscale imaging capabilities of scanning transmission electron microscopes (STEM), these mathematical models can replace some labor intensive procedures used to operate and maintain STEMs. This book, the first in its field since 1998, will also cover such relevant concepts as superresolution techniques, special denoising methods, application of mathematical/statistical learning theory, and compressed sensing. |