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High Resolution Electron Microscopy of Defects in Materials: Volume 183
Contributor(s): Sinclair, Robert (Editor), Smith, David J. (Editor), Dahmen, Ulrich (Editor)
ISBN: 1558990720     ISBN-13: 9781558990722
Publisher: Cambridge University Press
OUR PRICE:   $38.94  
Product Type: Hardcover - Other Formats
Published: August 1990
Qty:
Temporarily out of stock - Will ship within 2 to 5 weeks
Additional Information
BISAC Categories:
- Technology & Engineering | Materials Science - General
- Science | Nanoscience
Dewey: 620.112
LCCN: 90041466
Series: Mrs Proceedings
Physical Information: 1.1" H x 6.3" W x 9.1" (1.85 lbs) 420 pages