| Introduction to Focused Ion Beam Nanometrology Contributor(s): Cox, David C. (Author) |
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ISBN: 1643278460 ISBN-13: 9781643278469 Publisher: Morgan & Claypool OUR PRICE: $114.00 Product Type: Hardcover - Other Formats Published: October 2015 |
| Additional Information |
| BISAC Categories: - Technology & Engineering | Measurement - Science | Scientific Instruments - Science | Weights & Measures |
| Physical Information: 0.25" H x 7" W x 10" (0.81 lbs) 104 pages |