| An Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science Contributor(s): Fearn, Sarah (Author) |
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ISBN: 1643279106 ISBN-13: 9781643279107 Publisher: Morgan & Claypool OUR PRICE: $114.00 Product Type: Hardcover - Other Formats Published: October 2015 |
| Additional Information |
| BISAC Categories: - Technology & Engineering | Measurement - Science | Scientific Instruments - Technology & Engineering | Materials Science - General |
| Physical Information: 0.25" H x 7" W x 10" (0.75 lbs) 66 pages |