| Advanced Laser Diode Reliability Contributor(s): Vanzi, Massimo (Author), Bechou, Laurent (Author), Fukuda, Mitsuo (Author) |
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ISBN: 1785481541 ISBN-13: 9781785481543 Publisher: Iste Press - Elsevier OUR PRICE: $123.75 Product Type: Hardcover - Other Formats Published: July 2021 |
| Additional Information |
| BISAC Categories: - Technology & Engineering | Electronics - Solid State |
| LCCN: 2022300503 |
| Physical Information: 0.63" H x 6" W x 9" (1.17 lbs) 268 pages |
| Descriptions, Reviews, Etc. |
| Publisher Description: Advanced Laser Diode Reliability focuses on causes and effects of degradations of state-of-the-art semiconductor laser diodes. It aims to provide a tool for linking practical measurements to physical diagnostics. To this purpose, it reviews the current technologies, addressing their peculiar details that can promote specific failure mechanisms. Two sections will support this kernel: a) Failure Analysis techniques, procedures and examples; b) Device-oriented laser modelling and parameter extraction. |