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Silver Metallization: Stability and Reliability 2008 Edition
Contributor(s): Adams, Daniel (Author), Alford, Terry L. (Author), Mayer, James W. (Author)
ISBN: 184800026X     ISBN-13: 9781848000261
Publisher: Springer
OUR PRICE:   $104.49  
Product Type: Hardcover - Other Formats
Published: October 2007
Qty:
Additional Information
BISAC Categories:
- Technology & Engineering | Metallurgy
- Technology & Engineering | Materials Science - Metals & Alloys
- Technology & Engineering | Electronics - Circuits - Integrated
Dewey: 621.381
LCCN: 2007932625
Series: Engineering Materials and Processes
Physical Information: 0.5" H x 6.2" W x 9.4" (0.70 lbs) 123 pages
 
Descriptions, Reviews, Etc.
Publisher Description:

Here is the first book to discuss the current understanding of silver metallization and its potential as a future interconnect material for integrated circuit technology. With the lowest resistivity of all metals, silver is an attractive interconnect material for higher current densities and faster switching speeds in integrated circuits. Over the past ten years, extensive research has been conducted to address the issues that have prevented silver from being used as an interconnect metal. The authors provide details on a wide range of experimental, characterization, and analysis techniques. The book is written for students, scientists, engineers, and technologists in the fields of integrated circuits and microelectronics research and development.