| X-Ray Diffraction by Polycrystalline Materials Contributor(s): Guinebretière, René (Author) |
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ISBN: 1905209215 ISBN-13: 9781905209217 Publisher: Wiley-Iste OUR PRICE: $251.70 Product Type: Hardcover - Other Formats Published: March 2007 Annotation: Through both history and theory, this text presents a physical approach to the diffraction phenomenon and its applications in materials science. Chapters cover the discovery of x-ray diffraction and its physical effect on perfect and imperfect crystals as well as an analysis of the instruments used in the characterization of powdered materials or thin films and recent developments in the field. |
| Additional Information |
| BISAC Categories: - Technology & Engineering | Electrical - Technology & Engineering | Electronics - General - Science | Physics - Crystallography |
| Dewey: 548.83 |
| LCCN: 2006037726 |
| Physical Information: 1.02" H x 6.44" W x 9.45" (1.54 lbs) 351 pages |
| Descriptions, Reviews, Etc. |
| Publisher Description: This book presents a physical approach to the diffraction phenomenon and its applications in materials science. An historical background to the discovery of X-ray diffraction is first outlined. Next, Part 1 gives a description of the physical phenomenon of X-ray diffraction on perfect and imperfect crystals. Part 2 then provides a detailed analysis of the instruments used for the characterization of powdered materials or thin films. The description of the processing of measured signals and their results is also covered, as are recent developments relating to quantitative microstructural analysis of powders or epitaxial thin films on the basis of X-ray diffraction. Given the comprehensive coverage offered by this title, anyone involved in the field of X-ray diffraction and its applications will find this of great use. |