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General trace and log analysis patterns allow the application of uniform diagnostics and anomaly detection across diverse software environments. This pattern language covers any execution artifact from a small debugging trace to a distributed log with billions of messages from hundreds of computers, thousands of software components, threads, and processes. Pattern-oriented trace and log analysis is applicable to troubleshooting and debugging Windows, Mac OS X, Linux, FreeBSD, Android, iOS, z/OS, and any other possible computer platform including networking and IoT. Its pattern catalog is a part of pattern-oriented software data analysis, diagnostics, anomaly detection, forensics, prognostics, root cause analysis, and debugging developed by Software Diagnostics Institute (DumpAnalysis.org + TraceAnalysis.org). Also, the scope of applicability of such analysis patterns is much wider than just software execution artifacts or temporal data and now includes general data and image analysis (space-like narratology). This reference reprints with corrections 166 patterns originally published in Memory Dump Analysis Anthology volumes 3 - 11 and Software Diagnostics Library (former Crash Dump Analysis blog, DumpAnalysis.org/blog). It also includes an additional 11 analysis patterns from the forthcoming volume 12 bringing the total analysis pattern count to 177. Full-color diagrams accompany almost all pattern descriptions. The third edition includes 44 more patterns, additional diagrams for several old analysis pattern descriptions, updated endnote links and bibliography, two appendixes outlining the analysis pattern classification and the influence of narratology and contemporary mathematics on some pattern language names.