| Fundamentals of Electromigration-Aware Integrated Circuit Design Softcover Repri Edition Contributor(s): Lienig, Jens (Author), Thiele, Matthias (Author) |
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ISBN: 3030088111 ISBN-13: 9783030088118 Publisher: Springer OUR PRICE: $94.99 Product Type: Paperback - Other Formats Published: December 2018 |
| Additional Information |
| BISAC Categories: - Technology & Engineering | Electronics - Circuits - General - Computers | Systems Architecture - General - Computers | Hardware - Mainframes & Minicomputers |
| Dewey: 004.1 |
| Physical Information: 0.4" H x 8.4" W x 9.2" (0.50 lbs) 159 pages |
| Descriptions, Reviews, Etc. |
| Publisher Description: The book provides a comprehensive overview of electromigration and its effects on the reliability of electronic circuits. It introduces the physical process of electromigration, which gives the reader the requisite understanding and knowledge for adopting appropriate counter measures. A comprehensive set of options is presented for modifying the present IC design methodology to prevent electromigration. Finally, the authors show how specific effects can be exploited in present and future technologies to reduce electromigration's negative impact on circuit reliability. |