| Active Probe Atomic Force Microscopy: A Practical Guide on Precision Instrumentation 2024 Edition Contributor(s): Xia, Fangzhou (Author), Rangelow, Ivo W. (Author), Youcef-Toumi, Kamal (Author) |
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ISBN: 3031442326 ISBN-13: 9783031442322 Publisher: Springer OUR PRICE: $94.99 Product Type: Hardcover Published: February 2024 |
| Additional Information |
| BISAC Categories: - Technology & Engineering | Measurement - Technology & Engineering | Electronics - General - Technology & Engineering | Mechanical |
| Physical Information: 0.63" H x 9.13" W x 6.14" (1.90 lbs) 366 pages |