| Hot Carrier Degradation in Semiconductor Devices 2015 Edition Contributor(s): Grasser, Tibor (Editor) |
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ISBN: 3319089935 ISBN-13: 9783319089935 Publisher: Springer OUR PRICE: $104.49 Product Type: Hardcover Published: November 2014 |
| Additional Information |
| BISAC Categories: - Technology & Engineering | Electronics - Circuits - General |
| Dewey: 621.381 |
| Physical Information: 1.13" H x 6.14" W x 9.21" (2.01 lbs) 517 pages |
| Descriptions, Reviews, Etc. |
| Publisher Description: This book provides readers with a variety of tools to address the challenges posed by hot carrier degradation, one of today's most complicated reliability issues in semiconductor devices. Coverage includes an explanation of carrier transport within devices and book-keeping of how they acquire energy ("become hot"), interaction of an ensemble of colder and hotter carriers with defect precursors, which eventually leads to the creation of a defect, and a description of how these defects interact with the device, degrading its performance. |
