| Structural, Syntactic, and Statistical Pattern Recognition: Joint Iapr International Workshop, S+sspr 2016, Mérida, Mexico, November 29 - December 2, 2016 Edition Contributor(s): Robles-Kelly, Antonio (Editor), Loog, Marco (Editor), Biggio, Battista (Editor) |
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ISBN: 3319490540 ISBN-13: 9783319490540 Publisher: Springer OUR PRICE: $52.24 Product Type: Paperback Published: November 2016 |
| Additional Information |
| BISAC Categories: - Computers | Computer Vision & Pattern Recognition - Computers | Information Technology - Computers | Databases - Data Mining |
| Dewey: 006.3 |
| Series: Lecture Notes in Computer Science |
| Physical Information: 1.22" H x 6.14" W x 9.21" (1.84 lbs) 588 pages |
| Descriptions, Reviews, Etc. |
| Publisher Description: This book constitutes the proceedings of the Joint IAPR International Workshop on Structural Syntactic, and Statistical Pattern Recognition, S+SSPR 2016, consisting of the International Workshop on Structural and Syntactic Pattern Recognition SSPR, and the International Workshop on Statistical Techniques in Pattern Recognition, SPR. The 51 full papers presented were carefully reviewed and selected from 68 submissions. They are organized in the following topical sections: dimensionality reduction, manifold learning and embedding methods; dissimilarity representations; graph-theoretic methods; model selection, classification and clustering; semi and fully supervised learning methods; shape analysis; spatio-temporal pattern recognition; structural matching; text and document analysis. |