| Using Imperfect Semiconductor Systems for Unique Identification 2017 Edition Contributor(s): Roberts, Jonathan (Author) |
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ISBN: 3319678906 ISBN-13: 9783319678900 Publisher: Springer OUR PRICE: $104.49 Product Type: Hardcover - Other Formats Published: September 2017 |
| Additional Information |
| BISAC Categories: - Technology & Engineering | Electronics - Semiconductors - Technology & Engineering | Engineering (general) - Technology & Engineering | Materials Science - Electronic Materials |
| Dewey: 537.622 |
| Series: Springer Theses |
| Physical Information: 0.38" H x 6.14" W x 9.21" (0.83 lbs) 123 pages |
| Descriptions, Reviews, Etc. |
| Publisher Description: This thesis describes novel devices for the secure identification of objects or electronic systems. The identification relies on the the atomic-scale uniqueness of semiconductor devices by measuring a macroscopic quantum property of the system in question. Traditionally, objects and electronic systems have been securely identified by measuring specific characteristics: common examples include passwords, fingerprints used to identify a person or an electronic device, and holograms that can tag a given object to prove its authenticity. Unfortunately, modern technologies also make it possible to circumvent these everyday techniques. Variations in quantum properties are amplified by the existence of atomic-scale imperfections. As such, these devices are the hardest possible systems to clone. They also use the least resources and provide robust security. Hence they have tremendous potential significance as a means of reliably telling the good guys from the bad. |