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Novel Application of Anomalous (Resonance) X-Ray Scattering for Structural Characterization of Disordered Materials
Contributor(s): Waseda, Y. (Author)
ISBN: 3540133593     ISBN-13: 9783540133599
Publisher: Springer
OUR PRICE:   $52.24  
Product Type: Paperback - Other Formats
Published: July 1984
Qty:
Additional Information
BISAC Categories:
- Science | Physics - Crystallography
- Science | Earth Sciences - Mineralogy
- Technology & Engineering | Materials Science - General
Dewey: 548.83
Series: Lecture Notes in Physics
Physical Information: 0.42" H x 6.14" W x 9.21" (0.62 lbs) 186 pages