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Diffraction Analysis of the Microstructure of Materials 2004 Edition
Contributor(s): Mittemeijer, Eric J. (Editor), Scardi, Paolo (Editor)
ISBN: 3540405194     ISBN-13: 9783540405191
Publisher: Springer
OUR PRICE:   $208.99  
Product Type: Hardcover - Other Formats
Published: November 2003
Qty:
Additional Information
BISAC Categories:
- Technology & Engineering | Materials Science - Thin Films, Surfaces & Interfaces
- Science | Physics - Condensed Matter
- Technology & Engineering | Nanotechnology & Mems
Dewey: 620.112
LCCN: 2003059237
Series: Springer Materials Science
Physical Information: 1.25" H x 6.14" W x 9.21" (2.18 lbs) 554 pages
 
Descriptions, Reviews, Etc.
Publisher Description:

Overview of diffraction methods applied to the analysis of the microstructure of materials. Since crystallite size and the presence of lattice defects have a decisive influence on the properties of many engineering materials, information about this microstructure is of vital importance in developing and assessing materials for practical applications. The most powerful and usually non-destructive evaluation techniques available are X-ray and neutron diffraction. The book details, among other things, diffraction-line broadening methods for determining crystallite size and atomic-scale strain due, e.g. to dislocations, and methods for the analysis of residual (macroscale) stress. The book assumes only a basic knowledge of solid-state physics and supplies readers sufficient information to apply the methods themselves.