Diffraction Analysis of the Microstructure of Materials 2004 Edition Contributor(s): Mittemeijer, Eric J. (Editor), Scardi, Paolo (Editor) |
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ISBN: 3540405194 ISBN-13: 9783540405191 Publisher: Springer OUR PRICE: $208.99 Product Type: Hardcover - Other Formats Published: November 2003 |
Additional Information |
BISAC Categories: - Technology & Engineering | Materials Science - Thin Films, Surfaces & Interfaces - Science | Physics - Condensed Matter - Technology & Engineering | Nanotechnology & Mems |
Dewey: 620.112 |
LCCN: 2003059237 |
Series: Springer Materials Science |
Physical Information: 1.25" H x 6.14" W x 9.21" (2.18 lbs) 554 pages |
Descriptions, Reviews, Etc. |
Publisher Description: Overview of diffraction methods applied to the analysis of the microstructure of materials. Since crystallite size and the presence of lattice defects have a decisive influence on the properties of many engineering materials, information about this microstructure is of vital importance in developing and assessing materials for practical applications. The most powerful and usually non-destructive evaluation techniques available are X-ray and neutron diffraction. The book details, among other things, diffraction-line broadening methods for determining crystallite size and atomic-scale strain due, e.g. to dislocations, and methods for the analysis of residual (macroscale) stress. The book assumes only a basic knowledge of solid-state physics and supplies readers sufficient information to apply the methods themselves. |