| Nanoscale Spectroscopy and Its Applications to Semiconductor Research 2002 Edition Contributor(s): Watanabe, Y. (Editor), Heun, S. (Editor), Salviati, G. (Editor) |
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ISBN: 3540433120 ISBN-13: 9783540433125 Publisher: Springer OUR PRICE: $104.49 Product Type: Hardcover Published: July 2002 Annotation: Fabrication technologies for nanostructured devices have been developed recently, and the electrical and optical properties of such nanostructures are a subject of advanced research. This book describes the different approaches to spectroscopic microscopy, i.e., Electron Beam Probe Spectroscopy, Spectroscopic Photoelectron Microscopy, and Scanning Probe Spectroscopy. It will be useful as a compact source of reference for the experienced reseracher, taking into account at the same time the needs of postgraduate students and nonspecialist researchers by using a tutorial approach throughout. |
| Additional Information |
| BISAC Categories: - Technology & Engineering | Electronics - Semiconductors - Technology & Engineering | Nanotechnology & Mems - Technology & Engineering | Optics |
| Dewey: 530.41 |
| LCCN: 2002021076 |
| Series: Lecture Notes in Physics |
| Physical Information: 0.98" H x 6.6" W x 9.54" (1.35 lbs) 308 pages |
| Descriptions, Reviews, Etc. |
| Publisher Description: Fabrication technologies for nanostructured devices have been developed recently, and the electrical and optical properties of such nanostructures are a subject of advanced research. This book describes the different approaches to spectroscopic microscopy, i.e., Electron Beam Probe Spectroscopy, Spectroscopic Photoelectron Microscopy, and Scanning Probe Spectroscopy. It will be useful as a compact source of reference for the experienced reseracher, taking into account at the same time the needs of postgraduate students and nonspecialist researchers by using a tutorial approach throughout. |