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Scanning Electron Microscopy: Physics of Image Formation and Microanalysis Compl Rev & Upd Edition
Contributor(s): Hawkes, P. W., Reimer, Ludwig (Author)
ISBN: 3540639764     ISBN-13: 9783540639763
Publisher: Springer
OUR PRICE:   $313.49  
Product Type: Hardcover - Other Formats
Published: September 1998
Qty:
Annotation: Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.
Additional Information
BISAC Categories:
- Science | Electron Microscopes & Microscopy
- Science | Physics - Condensed Matter
- Science | Spectroscopy & Spectrum Analysis
Dewey: 502.825
LCCN: 98026178
Series: Springer Series in Optical Sciences
Physical Information: 0.99" H x 6.38" W x 9.53" (1.96 lbs) 529 pages
 
Descriptions, Reviews, Etc.
Publisher Description:
Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.