| Scanning Electron Microscopy: Physics of Image Formation and Microanalysis Compl Rev & Upd Edition Contributor(s): Hawkes, P. W., Reimer, Ludwig (Author) |
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ISBN: 3540639764 ISBN-13: 9783540639763 Publisher: Springer OUR PRICE: $313.49 Product Type: Hardcover - Other Formats Published: September 1998 Annotation: Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information. |
| Additional Information |
| BISAC Categories: - Science | Electron Microscopes & Microscopy - Science | Physics - Condensed Matter - Science | Spectroscopy & Spectrum Analysis |
| Dewey: 502.825 |
| LCCN: 98026178 |
| Series: Springer Series in Optical Sciences |
| Physical Information: 0.99" H x 6.38" W x 9.53" (1.96 lbs) 529 pages |
| Descriptions, Reviews, Etc. |
| Publisher Description: Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information. |